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Non Contact Flatness Measurement Topmap Series TMS-150

TMS 150
SURFACE CHARACTERIZATION WITH WHITE-LIGHT INTERFEROMETRY

The TopMap Metro.Lab from Polytec is a high-precision white-light interferometer (coherence scanning interferometer) with a large vertical range and nanometer resolution. This means the Metro.Lab topography measurement system is ideally suited to the non-contact measurement of flatness, step heights and parallelisms of large surfaces and structures even on soft and delicate materials.

Measuring area: 37 x 28 mm
Vertical measuring range: 70 mm 
Vertical resolution: 2.83 nm 
Extended measuring area: 87 mm x 78 mm
Check: Flatness, SA, Step height
 
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