TMS2400 C Micro.View+ Compact

The Micro.View+Compact deliversthe most detailed analysis of surface roughness, texture and microstructure topography. Combine 3D data with
color information for amazing vizualizations and extended analysis like detailed documentation of defects. The high-resolution 5 MP camera delivers incredibly detailed 3D data vizualization of engineered surfaces.


 

Resolution of sup-nano < 1 nm , Scan up to 100 mm in the Z axis

The design is a compact system, Color information

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