POLYTEC: TopMap Micro.View (TMS-1400)
TopMap Micro.View (TMS-1400)
A high-precision non-contact 3D Optical Surface Profiler utilizing White-Light Interferometry Technology. Designed as a "Compact Table-top" model, it integrates high-end technology into a single unit with electronics and control systems built directly into the stand to save space. It is ideal for both research laboratories and production lines where space is limited.
Key features include:
• CST (Continuous Scanning Technology): Use a high-resolution Z-axis motor combined with specialized algorithms to reduce measurement errors and significantly save time.
• ECT (Environmental Compensation Technology): A system that compensates for external vibrations, enabling nanometer-level measurements even in vibrating production environments.
• Focus Finder: An intelligent system that automatically finds the focus of the sample.
• Very High Vertical Resolution: Sub-nanometer level resolution (< 1 nm), enabling highly accurate roughness measurements independent of lens magnification.
• High Z Measurement Range: Up to 100 mm (with CST technology).
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For more information, please contact us
Industrial Instruments Division
Hollywood International Ltd.
Tel. 02-653-8555, 02-653-8255, 02-251-6023 Ext. 700, 701, 720, 726
E-mail: inds@hollywood.co.th
Website: http://www.hollywood.co.th
A high-precision non-contact 3D Optical Surface Profiler utilizing White-Light Interferometry Technology. Designed as a "Compact Table-top" model, it integrates high-end technology into a single unit with electronics and control systems built directly into the stand to save space. It is ideal for both research laboratories and production lines where space is limited.
Key features include:
• CST (Continuous Scanning Technology): Use a high-resolution Z-axis motor combined with specialized algorithms to reduce measurement errors and significantly save time.
• ECT (Environmental Compensation Technology): A system that compensates for external vibrations, enabling nanometer-level measurements even in vibrating production environments.
• Focus Finder: An intelligent system that automatically finds the focus of the sample.
• Very High Vertical Resolution: Sub-nanometer level resolution (< 1 nm), enabling highly accurate roughness measurements independent of lens magnification.
• High Z Measurement Range: Up to 100 mm (with CST technology).
____________________________________
For more information, please contact us
Industrial Instruments Division
Hollywood International Ltd.
Tel. 02-653-8555, 02-653-8255, 02-251-6023 Ext. 700, 701, 720, 726
E-mail: inds@hollywood.co.th
Website: http://www.hollywood.co.th